5.00 credits
30.0 h + 15.0 h
Q2
Teacher(s)
Delcorte Arnaud; Nysten Bernard;
Language
English
> French-friendly
> French-friendly
Main themes
- Introduction to Surface Science;
- Electron spectrometries (LEED, AES, XPS) and Ion spectrometries (ISS, RBS, SIMS) ;
- Near field microscopies (STM, AFM).
Learning outcomes
At the end of this learning unit, the student is able to : | |
1 |
Contribution of the course to the program objectives LO : 1.1, 2.1, 2.3, 5.5 Specific learning outcomes of the course a. Disciplinary Learning Outcomes: Electron and ionic spectroscopies: At the end of the course, the student will be able to
At the end of the course, the student will be able to
At the end of the course, the student will be able to:
|
Content
1. Introduction ro surface science
2. Electronic and ionic spectroscopies
2.1. Surface crystalline structure with LEED
2.2. Surface composition and chemistry with XPS/ESCA
2.3. Chemical imaging and depth-profiling with SIMS
2.4. High resolution elemental imaging with Auger
2.5. Topmost layer analysis with ISS
2.6. Quantitative analysis with Auger and XPS
2.7. Fundamental aspects in (cluster) SIMS
3. Scanning probe microscopies
3.1. Scanning tunnelling microscopy and spectroscopy
3.2. Atomic force microscopies
3.2.1. Contact mode microscopies : C-AFM, LFM, FMM, CS-AFM, PFM, ...
3.2.2. Resonant mode microscopies : AM-AFM, FM-AFM, MFM, EFM, KPFM, ...
3.2.3. Instrumental aspects : scanner, probes, artifacts, ...
2. Electronic and ionic spectroscopies
2.1. Surface crystalline structure with LEED
2.2. Surface composition and chemistry with XPS/ESCA
2.3. Chemical imaging and depth-profiling with SIMS
2.4. High resolution elemental imaging with Auger
2.5. Topmost layer analysis with ISS
2.6. Quantitative analysis with Auger and XPS
2.7. Fundamental aspects in (cluster) SIMS
3. Scanning probe microscopies
3.1. Scanning tunnelling microscopy and spectroscopy
3.2. Atomic force microscopies
3.2.1. Contact mode microscopies : C-AFM, LFM, FMM, CS-AFM, PFM, ...
3.2.2. Resonant mode microscopies : AM-AFM, FM-AFM, MFM, EFM, KPFM, ...
3.2.3. Instrumental aspects : scanner, probes, artifacts, ...
Teaching methods
Electron and ionic spectroscopies:
9 lectures of 2h each (including a 1 hour general introduction on surface science) and 2 laboratories illustrating selected techniques (instrumental aspects + data interpretation; reports asked to the students).
Scanning probe microscopies (SPM):
5 lectures of 2h each and 2 laboratories illustrating two SPM techniques. For the laboratories, students of 2nd Master are encouraged to bring their own samples.
9 lectures of 2h each (including a 1 hour general introduction on surface science) and 2 laboratories illustrating selected techniques (instrumental aspects + data interpretation; reports asked to the students).
Scanning probe microscopies (SPM):
5 lectures of 2h each and 2 laboratories illustrating two SPM techniques. For the laboratories, students of 2nd Master are encouraged to bring their own samples.
Evaluation methods
Oral examination regarding the competencies that have to be acquired
Laboratory reports
Spectroscopy section (Delcorte): Possibility of presenting a seminar in front of the group (~1/2 of the points for this section).
Laboratory reports
Spectroscopy section (Delcorte): Possibility of presenting a seminar in front of the group (~1/2 of the points for this section).
Other information
It is highly recommended to have attended the LMAPR2011 « Methods of Physical and Chemical Analysis » course or an equivalent.
Online resources
Moodle site : https://moodle.uclouvain.be/course/view.php?id=1895
Bibliography
Spectroscopies électroniques et ioniques :
- Dias présentées aux cours, disponibles sur Moodle
- Notes d'application des fabricants d'équipement
- Liste d'ouvrages de référence, que les étudiants peuvent trouver à la bibliothèque / au laboratoire
- Notes de cours évolutives (syllabus) disponible au SICI et sur Moodle
- Dias présentées aux cours, prospectus et notes d'application de fabricants d'équipement disponibles sur Moodle
Faculty or entity
FYKI