Scanning Probe Microscopy School

IMCN

16-17 September 2020

We announce the NanoInnovation School on Scanning Probe Microscopy (SPM), which will be held as a satellite event of NanoInnovation 2020. After the success of the school on electron microscopy during the past edition of NanoInnovation, the topic of the this year school will be focused on the most recent SPM techniques, including atomic force microscopy (AFM), scanning tunneling microscopy (STM), scanning near field optical microscopy (SNOM) and other scanning probe methods, for advanced functional characterization (electric, magnetic, mechanical, chemical…) of materials at the nanometer scale. Further information and a preliminary list of topics and speakers can be found here:

 

Published on August 31, 2020