Publications by author

IMMC

Marie-Stéphane Colla

Publications


Journal Articles


1. Lemoine, Guerric; Delannay, Laurent; Idrissi, Hosni; Colla, Marie-Stéphane; Pardoen, Thomas. Dislocation and back stress dominated viscoplasticity in freestanding sub-micron Pd films. In: Acta Materialia, Vol. 111, p. 10-21 (2016). doi:10.1016/j.actamat.2016.03.038. http://hdl.handle.net/2078.1/173058

2. Pardoen, Thomas; Colla, Marie-Stéphane; Idrissi, Hosni; Amin-Ahmadi, Behnam; Wang, Binjie; Schryvers, Dominique; Bhaskar, Umesh Kumar; Raskin, Jean-Pierre. A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects. In: Comptes rendus. Physique, Vol. 17, no.3-4, p. 485-495 (2016). doi:10.1016/j.crhy.2015.11.005. http://hdl.handle.net/2078.1/170012

3. Colla, Marie-Stéphane; Amin-Ahmadi, B.; Idrissi, Hosni; Malet, L.; Godet, S.; Raskin, Jean-Pierre; Schryvers, D.; Pardoen, Thomas. Dislocation-mediated relaxation in nanograined columnar palladium films revealed by on-chip time-resolved HRTEM testing. In: Nature Communications, Vol. 6, p. 5922 (2015). doi:10.1038/ncomms6922. http://hdl.handle.net/2078.1/154318

4. Guisbiers, Grégory; Colla, Marie-Stéphane; Coulombier, Michaël; Raskin, Jean-Pierre; Pardoen, Thomas. Study of creep/relaxation mechanisms in thin freestanding nanocrystalline palladium films through the lab-on-chip technology. In: Journal of Applied Physics, Vol. 113, no.024513, p. 024513-1 - 024513-6 (2013). doi:10.1063/1.4775398. http://hdl.handle.net/2078.1/121110

5. Amin-Ahmadi, B.; Idrissi, Hosni; Galceran, M; Colla, Marie-Stéphane; Raskin, Jean-Pierre; Pardoen, Thomas; Godet, Stéphane; Schryvers, D. Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline Pd thin films. In: Thin Solid Films, Vol. 539, p. 145-150. doi:10.1016/j.tsf.2013.05.083. http://hdl.handle.net/2078.1/141386

6. Coulombier, Michaël; Guisbiers, Grégory; Colla, Marie-Stéphane; Raskin, Jean-Pierre; Pardoen, Thomas. On-chip stress relaxation testing method for freestanding thin film materials. In: Review of Scientific Instruments, Vol. 83, no.10, pp. 105004 - 105004-9 (2012). doi:10.1063/1.4758288. http://hdl.handle.net/2078/118674

7. Wang, Binjie; Idrissi, Hosni; Galceran, M.; Colla, Marie-Stéphane; Turner, S.; Hui, S.; Raskin, Jean-Pierre; Pardoen, Thomas; Godet, Stéphane; Schryvers, D. Advanced TEM investigation of the plasticity mechanisms in nanocrystalline freestanding palladium films with nanoscale twins. In: International Journal of Plasticity, Vol. 37, p. 140-156 (2012). doi:10.1016/j.ijplas.2012.04.003. http://hdl.handle.net/2078.1/112921

8. Colla, Marie-Stéphane; Wang, Binjie; Idrissi, Hosni; Schryvers, D.; Raskin, Jean-Pierre; Pardoen, Thomas. High strength-ductility of thin nanocrystalline palladium films with nanoscale twins : On-chip testing and grain aggregate model. In: Acta Materialia, Vol. 60, no. 4, p. 1795-1806 (February 2012). doi:10.1016/j.actamat.2011.11.054. http://hdl.handle.net/2078.1/106909

9. Wang, Binjie; Idrissi, Hosni; Shi, H.; Colla, Marie-Stéphane; Michotte, Sébastien; Raskin, Jean-Pierre; Pardoen, Thomas; Schryvers, D. Texture dependent twin formation in nanocrystalline thin Pd films. In: Scripta Materialia, Vol. 66, no. 11, p. 866-871 (june 2012). doi:10.1016/j.scriptamat.2012.01.038. http://hdl.handle.net/2078.1/107129

10. Idrissi, Hosni; Wang, Binjie; Colla, Marie-Stéphane; Raskin, Jean-Pierre; Schryvers, Dominique; Pardoen, Thomas. Ultrahigh Strain Hardening in Thin Palladium Films with Nanoscale Twins. In: Advanced Materials, Vol. 23, no. 18, p. 2119-2122. doi:10.1002/adma.201004160. http://hdl.handle.net/2078.1/74210


Conference Papers


1. Lemoine, Guerric; Colla, Marie-Stéphane; Pardoen, Thomas; Delannay, Laurent. Dislocation and back stress dominated viscoplasticity in freestanding sub-micron Pd films. http://hdl.handle.net/2078.1/177394

2. Lemoine, Guerric; Colla, Marie-Stéphane; Idrissi, Hosni; Pardoen, Thomas; Delannay, Laurent. Dislocation and back stress dominated viscoplasticity in free-standing sub-micron Pd films. http://hdl.handle.net/2078.1/174809

3. Amin-Ahmadi, B.; Colla, Marie-Stéphane; Idrissi, Hosni; Malet, Loïc; Godet, Stéphane; Raskin, Jean-Pierre; Pardoen, Thomas; Schryvers, Dominique. Dislocation mediated hardening and relaxation in nanocrystalline palladium films revealed by on-chip HRTEM time-resolved nano mechanical testing.. In: Proceedings of the MMC 2015, 2015. http://hdl.handle.net/2078.1/173209

4. Lemoine, Guerric; Colla, Marie-Stéphane; Pardoen, Thomas; Delannay, Laurent. Crystal Plasticity based modelling of Viscoplasticity in Nanocrystalline FCC Thin Films. http://hdl.handle.net/2078.1/173465

5. Samain, L.; Colla, Marie-Stéphane; Richir, J.-B.; Lafort, A.; Kempeneers, C.; Volon, E.; Vignal, R.; Fourdrinier, L.. Development of Insulated Steel Substrate for PV Applications Using Roll-to-Roll Deposition Lines. http://hdl.handle.net/2078/181298

6. Idrissi, Hosni; Amin-Ahmadi, B.; Colla, Marie-Stéphane; Bollinger, C.; Boioli, F.; Raskin, Jean-Pierre; Cordier, P.; Pardoen, Thomas; Schryvers, Dominique. Small-scale plasticity mechanisms in crystalline and amorphous materials revealed by in-situ TEM nanomechanical testing. http://hdl.handle.net/2078.1/200241

7. Idrissi, Hosni; Colla, Marie-Stéphane; Amin-Ahmadi, B.; Delmelle, Renaud; Malet, L.; Proost, Joris; Godet, S.; Raskin, Jean-Pierre; Schryvers, D.; Pardoen, Thomas. Nanoscale plasticity mechanisms in as-deposited and hydride nanocrystalline Pd thin films revealed by advanced in-situ TEM nanomechanical testing. In: Book of abstracts, 2015. http://hdl.handle.net/2078.1/173268

8. Lemoine, Guerric; Colla, Marie-Stéphane; Amin-Ahmadi, B.; Idrissi, Hosni; Schryvers, D.; Raskin, Jean-Pierre; Pardoen, Thomas; Delannay, Laurent. Study of creep/relaxation in nanocrystalline FCC thin films through internal-stress-actuated microtensile testing method. http://hdl.handle.net/2078.1/160868

9. Pardoen, Thomas; Coulombier, Michaël; Colla, Marie-Stéphane; Lemoine, Guerric; Vayrette, Renaud; Ghidelli, Matteo; Blandin, Jean-Jacques; Gravier, Sébastien; Delannay, Laurent; Raskin, Jean-Pierre. Size dependent plastic localization in thin nanocrystalline or amorphous metallic films. http://hdl.handle.net/2078.1/173420

10. Lemoine, Guerric; Colla, Marie-Stéphane; Idrissi, Hosni; Raskin, Jean-Pierre; Pardoen, Thomas; Delannay, Laurent. Crystal plasticity based modelling of strain hardening and creep in nanocrystalline freestanding Pd films. http://hdl.handle.net/2078.1/157189

11. Lemoine, Guerric; Colla, Marie-Stéphane; Idrissi, Hosni; Raskin, Jean-Pierre; Pardoen, Thomas; Delannay, Laurent. Crystal plasticity based modelling of strain hardening and creep in nanocrystalline freestanding Pd films. http://hdl.handle.net/2078.1/157190

12. Lemoine, Guerric; Colla, Marie-Stéphane; Raskin, Jean-Pierre; Pardoen, Thomas; Delannay, Laurent. Crystal plasticity based modelling of strain hardening and creep in nanocrystalline FCC thin films. http://hdl.handle.net/2078.1/146547

13. Idrissi, Hosni; Amin-Ahmadi, B.; Colla, Marie-Stéphane; Kobler, A.; Coulombier, Michaël; Raskin, Jean-Pierre; Kübel, C.; Pardoen, Thomas; Schryvers, Dominique. Study of nanoscale deformation mechanisms in nanocrystalline materials using advanced micro/nanomechanical TEM testing. http://hdl.handle.net/2078.1/200248

14. Idrissi, Hosni; Colla, Marie-Stéphane; Ahmin-Ahmadi, B.; Kobler, A.; Coulombier, Michaël; Raskin, Jean-Pierre; Kübel, C.; Godet, Stéphane; Schryvers, Dominique; Pardoen, Thomas. Unravelling plasticity mechanisms in nanocrystalline metallic thin films using advanced in-situ TEM micro/nanomechanical testing. In: Book of abstracts, 2014. http://hdl.handle.net/2078.1/173396

15. Pardoen, Thomas; Colla, Marie-Stéphane; Coulombier, Michaël; Wang, B.; Idrissi, Hosni; Schryvers, Dominique; Raskin, Jean-Pierre. Failure in thin metallic films: on chip testing and size effects. http://hdl.handle.net/2078.1/173431

16. Colla, Marie-Stéphane; Amin-Ahmadi, B.; Pardoen, Thomas; Idrissi, Hosni; Malet, L.; Schryvers, D.; Godet, S.; Raskin, Jean-Pierre. In-situ characterization of the time dependent mechanical properties of nanocrystalline Pd thin films. http://hdl.handle.net/2078.1/173401

17. Pardoen, Thomas; Coulombier, Michaël; Colla, Marie-Stéphane; Raskin, Jean-Pierre; Idrissi, Hosni; Wang, B.; Schryvers, Dominique; Mompiou, Frédéric; Legros, M.. Size and rate dependent ductility of thin metallic films. http://hdl.handle.net/2078.1/173430

18. Idrissi, Hosni; Amin-Ahmadi, B.; Galceran, M.; Delmelle, Renaud; Colla, Marie-Stéphane; Raskin, Jean-Pierre; Godet, Stéphane; Proost, Joris; Pardoen, Thomas; Schryvers, D.. TEM Observation of FCC 9R Phase Transformation in Nanocrystalline Pd Thin Films during Hydriding/Dehydriding Cycles. In: Proceedings of the 142nd Annual Meeting of the Metallurgical Society (TMS), 2013, p.226. http://hdl.handle.net/2078.1/131949

19. Colla, Marie-Stéphane; Idrissi, Hosni; Amin-Ahmadi, B.; Schryvers, D.; Raskin, Jean-Pierre; Pardoen, Thomas. On the mechanical properties of palladium thin films: influence of the microstructure and of a passivation layer. http://hdl.handle.net/2078/123678

20. Colla, Marie-Stéphane; Wang, Bingyu; Idrissi, Hosni; Guisbiers, Grégory; Schryvers, D.; Raskin, Jean-Pierre; Pardoen, Thomas. Time dependent mechanical properties of palladium thin films: influence of microstructure and of the presence of a surface barrier. http://hdl.handle.net/2078/123654

21. Pardoen, Thomas; Coulombier, Michaël; Colla, Marie-Stéphane; Bhaskar, Umesh Kumar; Passi, Vikram; Houri, Samer; Raskin, Jean-Pierre; Idrissi, Hosni. On chip testing of (freestanding) thin films. In: Proceedings of the GDRi CNRS MECANO, Session I, Mechanical Testing, 2012, p. Paper 2. http://hdl.handle.net/2078/123770

22. Pardoen, Thomas; Coulombier, Michaël; Colla, Marie-Stéphane; Bhaskar, Umesh Kumar; Passi, Vikram; Houri, Samer; Raskin, Jean-Pierre; Idrissi, Hosni. On-chip testing of (freestanding) thin films. In: Proceedings of the Indentation 2012, 2012, p. Paper 1. http://hdl.handle.net/2078/123764

23. Colla, Marie-Stéphane; Wang, Binjie; Idrissi, Hosni; Guisbiers, Grégory; Schryvers, Dominique; Raskin, Jean-Pierre; Pardoen, Thomas. Mechanical Properties of Palladium Thin Films: High Strength/Ductility Balance Through Growth Nanotwins. In: Proceedings of ASME 2011 (McMat2011-4108), 2011. http://hdl.handle.net/2078.1/79131

24. Ryelandt, Sophie; Carbonnelle, Pierre; Coulombier, Michaël; Colla, Marie-Stéphane; Houri, Samer; Zeb, G.; Zulfiqar, A.; Bhaskar, Umesh Kumar; Raskin, Jean-Pierre; Pardoen, Thomas. High throughput lab-on-chip for testing the mechanical properties of thin films. In: Proceedings of the European Congress on Advanced Materials and Processes – EuroMAT 2011, 2011, p. poster D22-P-1-21. http://hdl.handle.net/2078/123518

25. Schryvers, D.; Idrissi, H.; Wang, Binjie; Colla, Marie-Stéphane; Raskin, Jean-Pierre; Pardoen, Thomas. Study of Twins in nanoscale Pd films with high strain hardening capacity. In: Proceedings of TMS Annual Meeting & Exhibition, 2011. http://hdl.handle.net/2078.1/79143

26. Pardoen, Thomas; Idrissi, Hosni; WANGA MVEMBA, Binjie; Colla, Marie-Stéphane; Raskin, Jean-Pierre; Schryvers, D.. Ultra High strain hardening in nanocrystalline Pd thin films with nanotwins. In: Plasticity'11, A.Khan ed. http://hdl.handle.net/2078.1/78597

27. Pardoen, Thomas; Coulombier, Michaël; Colla, Marie-Stéphane; Idrissi, Hosni; Wang, Binjie; Schrijvers, Dominique; Raskin, Jean-Pierre. Imperfection, rate and size dependent plastic localization in thin nanocrystalline metallic films. http://hdl.handle.net/2078.1/92189

28. Coulombier, Michaël; Guisbiers, Grégory; Colla, Marie-Stéphane; Raskin, Jean-Pierre; Pardoen, Thomas. Experimental evidences of competing stress relaxation mechanisms in thin Al/Si and Pd films tested on chip. http://hdl.handle.net/2078.1/107199

29. Schryvers, D.; Idrissi, Hosni; Wang, Binjie; Colla, Marie-Stéphane; Raskin, Jean-Pierre. TEM study of nanoscale Pd films with high strain hardening capacity. http://hdl.handle.net/2078.1/107205

30. Colla, Marie-Stéphane; Wang, Bingyu; Idrissi, Hosni; Guisbiers, Grégory; Schryvers, D.; Raskin, Jean-Pierre; Pardoen, Thomas. Ultra high strain hardening in nanocrystalline palladium thin films with nanotwins: an experimental study coupled to a phenomenological analytical mode. In: Proceedings of the ECI Conference on Nanomechanical Testing in Materials Research and Development, 2011, p. Paper 7. http://hdl.handle.net/2078/123588

31. Schrijvers, D.; Idrissi, H.; Wang, B.; Colla, Marie-Stéphane; Coulombier, Michaël; Boe, Alexandre; Proost, Joris; Raskin, Jean-Pierre; Pardoen, Thomas. TEM characterization of freestanding Pd and Al films for lab-on-chip nanomechanical tensile testing. In: Proceedings of the MICROSCIENCE 2010, 2010, p. paper M3.2 - 0062. http://hdl.handle.net/2078.1/75751

32. Wang, B.; Idrissi, H.; Colla, Marie-Stéphane; Coulombier, Michaël; Raskin, Jean-Pierre; Pardoen, Thomas; Schrijvers, D.. TEM characterization of freestanding metallic thin films deformed by controlled on chip internal stress. In: Proceedings of the 17th International Microscopy Congress - IMC17, 2010, p. paper M12505. http://hdl.handle.net/2078.1/75753

33. Idrissi, H.; Wang, B.; Colla, Marie-Stéphane; Raskin, Jean-Pierre; Schrijvers, D.; Pardoen, Thomas. TEM characterization of twinned nanocrystalline palladium thin films. In: Proceedings of the 2010 Materials Research Society Fall Meeting, 2010, p. paper # P1.3.. http://hdl.handle.net/2078.1/76200

34. Colla, Marie-Stéphane; Coulombier, Michaël; Boé, A.; Idrissi, H.; Wang, B.; Schrijvers, D.; Proost, Joris; Raskin, Jean-Pierre; Pardoen, Thomas. Characterization of the mechanical properties of freestanding palladium films by on chip internal stress controlled nanomechanical tensile testing. In: Proceedings of the Nanomechanical Testing Workshop and Hysitron User Meeting, INM: Saarbrücken, Germany, 2010, 29-30. http://hdl.handle.net/2078.1/70729

35. Brugger, Charles; Coulombier, Michaël; Boé, A.; Colla, Marie-Stéphane; Raskin, Jean-Pierre; Pardoen, Thomas. Size dependent ductility and fracture behaviour of thin freestanding metallic films. http://hdl.handle.net/2078.1/78936

36. Ryelandt, Sophie; Carbonnelle, Pierre; Boe, Alexandre; Coulombier, Michaël; Bhaskar, Umesh Kumar; Zulfiqar, Azeem; Colla, Marie-Stéphane; Dille, J.; Poirier, C.; Proost, Joris; Godet, Stéphane; Raskin, Jean-Pierre; Pardoen, Thomas. Nanomechanical testing of thin metallic films application to aluminium, palladium and chromium films. In: Proceedings of the European Conference on Nano Film - ECNF'10, 2010, p. 70. http://hdl.handle.net/2078.1/75749

37. Pardoen, Thomas; Coulombier, Michaël; Boé, A.; Brugger, Charles; Colla, Marie-Stéphane; Delannay, Laurent; Dancette, Sylvain; Idrissi, Hosni; Wang, B.; Schryvers, D.; Massart, T.J.; Raskin, Jean-Pierre. Imperfection and size dependent fracture of thin metallic films. In: Conference proceedings, 2010, p. 243. http://hdl.handle.net/2078.1/78948

38. Wang, Bingyu; Idrissi, Hosni; Colla, Marie-Stéphane; Coulombier, Michaël; Boé, Alexandre; Proost, J.; Raskin, Jean-Pierre; Pardoen, Thomas; Schryvers, D.. Nanomechanical tensile testing of metallic thin films. In: Proceedings of MICROSCIENCE 2010, 2010, p. Paper M3.2-0142. http://hdl.handle.net/2078/123511

39. Boé, A.; Coulombier, Michaël; Colla, Marie-Stéphane; Bhaskar, Umesh Kumar; Zulfiqar, Azeem; Pardoen, Thomas; Raskin, Jean-Pierre. Internal stress relaxation based method to extract the Young's modulus of brittle and ductile thin layers. In: Proceedings of the Innovations in Thin Film Processing ans Characterization, 2009, Paper O 3.3, p 12. http://hdl.handle.net/2078.1/75663

40. Pardoen, Thomas; Brugger, Charles; Coulombier, Michaël; Boe, Alexandre; Colla, Marie-Stéphane; Proost, Joris; Massart, T.J.; Raskin, Jean-Pierre. Imperfection and size dependent ductility of thin freestanding metallic films. http://hdl.handle.net/2078.1/70732

41. Boe, Alexandre; Coulombier, Michaël; Colla, Marie-Stéphane; Brugger, Charles; DILLE, JEAN; Proost, Joris; GODET, S.; Legros, M.; Mompiou, F.; Sharon, J.A.; Hemker, K.J.; Pardoen, Thomas; Raskin, Jean-Pierre. Lab-on-chip tensile stages for nanomechanical testing and TEM analysis. In: Proceedings of the 35 th International Conference on Micro & Nano Engineering, 2009, p. paper # O-MEMS-02. http://hdl.handle.net/2078.1/76869

42. Delmelle, Renaud; Colla, Marie-Stéphane; Pardoen, Thomas; Proost, Joris. In-situ study of the kinetics and durability of Pd-hydride formation for integrated hydrogen sensor applications. In: Proceedings, 2009, p. O4.5. http://hdl.handle.net/2078.1/70846

43. Colla, Marie-Stéphane; Delmelle, Renaud; Boé, A.; Coulombier, Michaël; Raskin, Jean-Pierre; Proost, Joris; Pardoen, Thomas. Impact of hydriding cycles on mechanical properties of palladium thin film. In: Proceedings of the Innovations in Thin Film Processing ans Characterization, 2009, Paper P 2.10, p 100. http://hdl.handle.net/2078.1/70731


Dissertations


1. Colla, Marie-Stéphane. Plasticity and creep in thin free-standing nanocrystalline Pd films, prom. : Pardoen, Thomas ; Raskin, Jean-Pierre, 25/03/2014. http://hdl.handle.net/2078.1/142828