LARA: LAser for Radiation Analysis
LARA is a general purpose laser testbench devoted to study the radiation susceptibility of semiconductor devices.
The systems consists in a high precission step motors (~0.1 um), a 1060 nm pulsed laser (PiLAS) with associated optics to obtain beam spots f ~5-6 um, and a set of photodetectors to measure both integrated and pulse-by-pulse optical power.
LARA will have two main applications:
1. Test of semiconductor sensors (pixel, microstrips, etc).
2. Study of single event effects (SEE) in semiconductor components.
A set of standard measurement equipment will be available to perform measurements for both type of applications.
External collaborators: Denis Flandre (UCLouvain - EPL).