Tests of electronic devices


CYCLONE, the cyclotron of Louvain-la-Neuve is able to accelerate different types of ions which may be used for the characterization of electronic components.

Several beam lines are used for these tests :

- Heavy Ion Facility (HIF)

- Light Ion Facility (LIF)

- Neutron Irradiation Facility (NIF)

A Cobalt60 source is also proposed for Gamma Irradiation (GIF)


The beam time planning is defined every six months for the heavy and light ions.

Beam time planning for the period February-July 2020 is available here.

If you want to reserve a period, please send us the beam request form.

For other types of beams, please contact us.