Tests of electronic devices


CYCLONE, the cyclotron of Louvain-la-Neuve is able to accelerate different types of ions which may be used for the characterization of electronic components.

Several beam lines are used for these tests :

- Heavy Ion Facility (HIF)

- Light Ion Facility (LIF)

- Neutron Irradiation Facility (NIF)

A Cobalt60 source is also proposed for Gamma Irradiation (GIF)


The beam time planning is defined every six months for the heavy and light ions.

If you want to reserve a period, please send us the beam request form.

For other types of beams, please contact us.