Wallonia ELectronics & COmunications MEasurements

Platform premises   IV & RF Cryogenic (4K) on Wafer Prober   RF & Microwave characterization (up to 170 GHz)   RF & 1/f Noise   RF materials tests 

Technical and scientific expertise

  • Service & expertise in electro-magnetic characterization of materials, devices, sensors, circuits, systems
  • Access to characterization infrastructure / Equipment renting accomplished by training (if necessary)
  • Measurement campaign realized by UCLouvain staff / PCB assembly and prototyping
  • Technical advice and consultancy, training for R&D engineers from industry

Main equipments

  • Various Probe stations
    • Semi-automatic MPI : 300mm, 20-300°C
    • Lakeshore: 51mm, 4-500 K, gases
  • ALFNA Noise Analyzer from Keysight
    • FET, BJT, Diode, Resistor, Circuit
    • Noise Floor: 2e-27 A^2/Hz
    • f: 3 mHz–40 MHz,
    • RTN: dt_min=2.5 nsec, ...
  • Vector Network Analyzer (s)
    • Large-band VNA: 900 Hz-125 GHz, 2 ports
    • PNA-X: 26.5 GHz, 4-ports, ...
  • Anechoic chamber (400 MHz-40 GHz & 60-90 GHz)
  • PolyTec Vibrometer
  • Semiconductor Analyzers

Discover all the equipment of the WELCOME platform in a catalogue and via a virtual visit.

Applications

Multiparametric characterisation of :

  •     materials
  •     components
  •     sensors
  •     antennas
  •     circuits
  •     electronic and communication systems

Services provided to

  • UCLouvain researchers and students
  • External users