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- Christian Renaux
Christian Renaux
Responsable Plateforme Winfab
2021
GALEMBECK, EGON HENRIQUE SALERNO ; Renaux, Christian ; SWART, JACOBUS WILLIBRORDUS ; Flandre, Denis ; GIMENEZ, SALVADOR PINILLOS. The Impact of LCE and PAMDLE Regarding Different CMOS ICs Nodes and High Temperatures. In: I E E E Journal of the Electron Devices Society, Vol. 9, p. 415-423 (2021). doi:10.1109/JEDS.2021.3071399.
2019
Salerno Galembeck, Egon Henrique ; Flandre, Denis ; Renaux, Christian ; Pinillos Gimenez, Salvador . Digital Performance of OCTO Layout Style on SOI MOSFET at High Temperature Environment. In: Journal of Integrated Circuits and Systems, Vol. 14, no.2, p. 8 (2019). doi:10.29292/jics.v14i2.34.
2017
Galembeck, Egon H.S. ; Renaux, Christian ; Flandre, Denis ; Finco, Saulo ; Gimenez, Salvador P.. Boosting the SOI MOSFET Electrical Performance by Using the Octogonal Layout Style in High Temperature Environment. In: IEEE Transactions on Device and Materials Reliability, Vol. 17, no.1, p. 1-8 (03/2017). doi:10.1109/TDMR.2017.2652729.
2015
Navarenho de Souza Fino, Leonardo ; Davini Neto, Enrico ; Aparecida Guazzelli da Silveira, Marcilei ; Renaux, Christian ; Flandre, Denis ; Pinillos Gimenez, Salvador. Boosting the total ionizing dose tolerance of digital switches by using OCTO SOI MOSFET. In: Semiconductor Science and Technology, Vol. 30, no.105024, p. 12 (07/09/2015). doi:10.1088/0268-1242/30/10/105024.
2015
Gimenez, Salvador Pinillos ; Galembeck, Egon Henrique Salerno ; Renaux, Christian ; Flandre, Denis. Diamond layout style impact on SOI MOSFET in high temperature environment. In: Microelectronics Reliability, Vol. MR_11492, p. 6 (13/03/2015). doi:10.1016/j.microrel.2015.02.015.
2015
N. de S. Fino, Leonardo ; A. G. Silveira, Marcilei ; Renaux, Christian ; Flandre, Denis ; Pinillos Gimenez, Salvador. The Influence of Back Gate Bias on the OCTO SOI MOSFET's Response to X-ray Radiation. In: Journal of Integrated Circuits and Systems, Vol. 10, no.1, p. 43-48 (2015).
2014
Gimenez, Salvador Pinillos ; Davini, Enrico ; Peruzzi, Vinicius ; Renaux, Christian ; Flandre, Denis. Compact diamond MOSFET model accounting for PAMDLE applicable down 150nm node. In: Electronics Letters, Vol. 50, no. 22, p. 1618-1620 (23/10/2014). doi:10.1049/el.2014.1229.
2013
Gimenez, Salvador Pinillos ; Leoni, Renato D. ; Renaux, Christian ; Flandre, Denis. Using diamond layout style to boost MOSFET frequency response of analogue IC. In: Electronics Letters, Vol. ELL-2013-4038.R2, no. 50-5, p. 398-400 (2013). doi:10.1049/el.2013.4038.
2012
Fino, L.N.S. ; Renaux, Christian ; Flandre, Denis ; Gimenez, P.. Experimental Study of the OCTO SOI nMOSFET and Its Application in Analog Integrated Circuits. In: ECS Transactions, Vol. 49, no.1, p. 527-534 (2012). doi:10.1149/04901.0527ecst.
2012
Peruzzi, V.V. ; Renaux, Christian ; Flandre, Denis ; Gimenez, S.P.. Experimental Validation of the Drain Current Analytical Model of the Fully Depleted Diamond SOI nMOSFETs by Using Paired T-test Statistical Evaluation. In: ECS Transactions, Vol. 49, no.1, p. 169-176 (2012). doi:10.1149/04901.0169ECST.
2011
Cortina Gil, Eduardo ; Soung Yee, Lawrence ; Renaux, Christian ; Flandre, Denis. TRAPPISTe pixel sensor with 2 µm SOI technology. In: Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment, Vol. 663, p. 19-21. doi:10.1016/j.nima.2010.06.109.
2004
Bawedin, Maryline ; Flandre, Denis ; Renaux, Christian. LDMOS in SOI technology with very-thin silicon film. In: Solid-State Electronics, Vol. 48, no. 12, p. 2263-2270 (2004). doi:10.1016/j.sse.2004.06.007.
2004
Haddab, Youssef ; Mosser, Vincent ; Lysowec, Mélanie ; Suski, Jan ; Demeûs, Laurent ; Renaux, Christian ; Adriaensen, Stéphane ; Flandre, Denis. Low-Noise SOI Hall Devices. In: Fluctuation and Noise Letters : an interdisciplinary scientific journal on random processes in physical, biological and technological systems, Vol. 4, no. 2, p. L345-L354 (2004). doi:10.1142/S021947750400194X.
2003
Hamadache, F. ; Renaux, Christian ; Duvail, JL ; Bertrand, Patrick. Interface investigations of iron and cobalt metallized porous silicon: AES and FTIR analyses. In: Physica Status Solidi. A: Applied Research, Vol. 197, no. 1, p. 168-174 (2003). doi:10.1002/pssa.200306494.
2001
Tang, Xiaohui ; Baie, Xavier ; Colinge, Jean-Pierre ; Loumaye, Pierre ; Renaux, Christian ; Bayot, Vincent. Influence of Device Geometry on SOI Single-Hole Transistor Characteristics. In: Microelectronics Reliability, Vol. 41, no. 11, p. 1841-1846 (2001). doi:10.1016/S0026-2714(01)00044-0.
1999
Renaux, Christian ; Scheuren, V ; Flandre, Denis. New experiments on the electrodeposition of iron in porous silicon. In: Microelectronics Reliability, Vol. 40, no. 4-5, p. 877-879 (2000). doi:10.1016/S0026-2714(99)00331-5.
2011
André, Nicolas ; Francis, Laurent ; Rue, Bertrand ; Renaux, Christian ; Flandre, Denis ; Raskin, Jean-Pierre. Artificial microbeams for sensing air flow, temperature and humidity by combining MEMS and CMOS technologies. In: Kris Iniewski, Optical, Acoustic, Magnetic, and Mechanical Sensor Technologies, CRC Press, 2011. 9781439869758.
2018
Vono Peruzzi, Vinicius ; da Silva, Gabriel Augusto ; Renaux, Christian ; Flandre, Denis ; Pinillos Gimenez, Salvador. Using Statistical Student's t-Test to Qualify the Electrical Performance of the Diamond MOSFETs. 2018 33rd Symposium on Microelectronics Technology and devices (SBMicro 2018) (Bento Gonçalves, Rio Grande do Sul (Brazil ), du 27/08/2018 au 31/08/2018). In: Proceedings of SBMicro 2018.
2017
Peruzzi, Vinicius Vono ; Renaux, Christian ; Flandre, Denis ; Gimenez, Salvador Pinillos. Comparative experimental study of the improved MOSFETs matching by using the hexagonal layout style. 2017 32nd Symposium on Microelectronics Technology and Devices (SBMicro 2017) ( Fortaleza (Brazil), du 28/08/2017 au 01/09/2017).
2016
Peruzzi, Vinicius Vono ; Renaux, Christian ; Flandre, Denis ; Gimenez, Salvador Pinillos. Boosting the MOSFETs matching by using diamond layout style. 31st Symposium on Microelectronics Technology and Devices (SBMicro) (Salvador (Brazil), du 29/08/2016 au 04/09/2016). doi:10.1109/SBMicro.2016.7731334.
2015
Fino, Leonardo Navarenho de Souza ; da Silveira, M.A.G. ; Renaux, Christian ; Flandre, Denis ; Gimenez, Salvador Pinillos. OCTO Layout Variations as an Alternative to Mitigate TID Effects. 10th Workshop on Semiconductors and Micro & Nano Technology (SEMINATEC 2015) (Sao Bernardo do Campo (Brazil), du 09/04/2015 au 10/04/2015). In: , 2015.
2014
de Souza Fino, Leonardo Navarenho ; Aparecida Guazzelli da Silveira, Marcilei ; Renaux, Christian ; Flandre, Denis ; Pinillos Gimenez, Salvador. Boosting the Radiation Hardness and Higher Reestablishing Pre-Rad Conditions by Using OCTO Layout Style for MOSFETs. 29th Symposium on Microelectronics Technology and Devices (SBMicro 2014) (Aracaju (Brazil), du 02/09/2014 au 05/09/2014). In: Proceedings of SBMicro 2014, 2014, 1-8. doi:10.1109/SBMicro.2014.6940133.
2013
de Souza Fino, Leonardo Navarenho ; Aparecida Guazzelli da Silveira, Marcilei ; Renaux, Christian ; Flandre, Denis ; Gimenez, Salvador Pinillos. Comparative Experimental Study of X-Ray Radiation Effects in the Threshold Voltage between the OCTO and Conventional SOI nMOSFETs. VIII Workshop on Semiconductors and Micro & Nano Technology (Seminatec 2013) (Campinas (Brazil), du 02/05/2013 au 03/05/2013). In: , 2013.
2013
Navarenho de Souza Fino, Leonardo ; Guazzelli da Silveira, Marcilei Aparecida ; Renaux, Christian ; Flandre, Denis ; Gimenez, Salvador Pinillos. Improving the X-ray radiation tolerance of the analog ICs by using OCTO layout style. 2013 Symposium on Microelectronics Technology and Devices (SBMicro 2013) (Curitiba (Brazil), du 02/09/2013 au 06/09/2013). In: Proceedings of SBMicro 2013, IEEE, 2013. 978-1-4799-0516-4, 1-4. doi:10.1109/SBMicro.2013.6676166. doi:10.1109/SBMicro.2013.6676166.
2013
de Souza Fino, Leonardo Navarenho ; Aparecida Guazzelli da Silveira, Marcilei ; Renaux, Christian ; Flandre, Denis ; Pinillos Gimenez, Salvador. Total Ionizing Dose Effects on the Digital performance of Irradiated OCTO and Conventional Fully Depleted SOI MOSFET. 14th European Conference on radiation and its Effects on Components and Systems (RADECS 2013) (Oxford (UK), du 23/09/2013 au 27/09/2013). In: , 2013.
2012
Navarenho de Souza Fino, L. ; Renaux, Christian ; Flandre, Denis ; Pinillos Gimenez, S.. Experimental Study of the OCTO SOI nMOSFET to Improve the Device Performance. Ninth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits (EUROSOI 2012) (La Grande Motte (France), du 24/01/2012 au 25/01/2012). In: Proceedings of the Ninth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits (EUROSOI 2012), 2012, 55-56.
2012
Fino, Leonardo ; Renaux, Christian ; Gimenez, Salvador ; Flandre, Denis. Using OCTO SOI nMOSFET to Reduce Die Area of Analog Integrated Circuits. VII Workshop on Semiconductor and Micro & Nano Technology, SEMINATEC 2012 (Sao Bernardo do Campo (Brazil), du 12/04/2012 au 13/04/2012). In: Proceedings of the VII Workshop on Semiconductor and Micro & Nano Technology, SEMINATEC 2012, 2012.
2011
Soung Yee, Lawrence ; Martin, Elena ; Cortina Gil, Eduardo ; Renaux, Christian ; Flandre, Denis. Charge Sensitive Amplifier Study in 2μm FD SOI CMOS. IEEE International SOI Conference (SOI 2011) (Tempe (USA), du 03/10/2011 au 06/10/2011). In: Proceedings of the IEEE International SOI Conference (SOI 2011), 2011. doi:10.1109/SOI.2011.6081694.
2009
Spiegel, Judith ; Renaux, Christian ; Darques, Michaël ; De La Torre, J. ; Piraux, Luc ; Simon, Pascal ; Raskin, Jean-Pierre ; Huynen, Isabelle. Ferromagnetic inductors on commercial nanoporous anodic alumina. 2009 European Microwave Conference (EuMC) (Rome, Italy, du 29/09/2009 au 01/10/2009), p. pp. 582-585. In: 2009 European Microwave Conference (EuMC), IEEE, 2009. 978-1-4244-4748-0, p. 582-585. doi:10.1109/EUMC.2009.5296230.
2009
Martin, Maria-Elena ; Soung Yee, Lawrence ; Cortina, Eduardo ; Renaux, Christian ; Flandre, Denis. Radiation Hard Pixel Sensor with SOI technology. 11th International Workshop on Radiation Imaging Detectors (IWoRID'09) (Prague (Czech Republic), du 28/06/2009 au 02/07/2009). In: Proceedings of IWoRID'09, 11th International Workshop on Radiation Imaging Detectors, 2009, p. II-61.
2009
Martin, E. ; Cortina Gil, Eduardo ; Yee, L.S. ; Renaux, Christian ; Flandre, Denis. TRAPPIST/sub e/ pixel sensor with 2 mu m SOI technology. 2009 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC 2009) (Orlando, FL, USA, 25-31 October 2009). In: 2009 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC 2009), IEEE, 2009. 978-1-4244-3961-4, p. 1692-1695. doi:10.1109/NSSMIC.2009.5402237.
2008
André, Nicolas ; Sobieski, Stanislas ; Renaux, Christian ; Flandre, Denis ; Raskin, Jean-Pierre. 3-D CMOS compatible MEMS sensors and actuators. Workshop on MEMS and Nanotechnology through Science and Applications (UCL/Louvain-la-Neuve (Belgium), 18/03/2008). In: proceedings of the Workshop on MEMS and Nanotechnology through Science and Applications, 2008.
2008
André, Nicolas ; Rue, Bertrand ; Renaux, Christian ; Flandre, Denis ; Raskin, Jean-Pierre. 3-D capacitive MEMS sensors co-integrated with SOI CMOS circuits. Fourth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2008) (Tyndall National Institute, Cork (Ireland), du 23/01/2008 au 25/01/2008). In: Proceedings of the EUROSOI - 2008, Fourth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits, 2008, 75-76.
2008
André, Nicolas ; Rue, Bertrand ; Renaux, Christian ; Raskin, Jean-Pierre ; Flandre, Denis. Artificial microbeams to sense air flow, temperature or humidity combining MEMS and CMOS technologies. Sensors and Sensing in Biology and Engineering Conference, October 12 – 16, 2008 (Cetraro (Italy), du 12/10/2008 au 16/10/2008).
2005
Tomaszewski, Daniel ; Flandre, Denis ; Renaux, Christian ; Grabiec, Piotr ; Kociubinski, Andrzej ; Kucharski, Krzysztof. Characterization of FD-SOI MOSFETs based on EKV model. MOS-AK Workshop 2005 (Grenoble (France), 16/09/2005). In: Proceedings of the MOS-AK Workshop 2005, 2005.
2005
Flandre, Denis ; Laconte, Jean ; Levacq, David ; Afzalian, Aryan ; Rue, Bertrand ; Renaux, Christian ; Iker, François ; Olbrechts, Benoît ; André, Nicolas ; Raskin, Jean-Pierre. SOI CMOS and MEMS for single-chip high-temperature microsystems. 2005 International Conference on High Temperature Electronics (HITEN 2005) (Paris (France), du 06/09/2005 au 08/09/2005). In: Proceedings of the 2005 International Conference on High Temperature Electronics (HITEN 2005), 2005, p. Paper n°1.
2004
Flandre, Denis ; Laconte, Jean ; Levacq, David ; Afzalian, Aryan ; Rue, Bertrand ; Renaux, Christian ; Iker, François ; Olbrechts, Benoît ; André, Nicolas ; Raskin, Jean-Pierre. SOI technology for single-chip harsh environment microsystems. Conference on Micro-Nano-Technologies for Aerospace Applications (CANEUS 2004) (Monterey (USA), du 01/11/2004 au 05/11/2004). In: Proceedings of the Conference on Micro-Nano-Technologies for Aerospace Applications (CANEUS 2004), 2004, 157-169.
2003
Haddab, Youcef ; Mosser, Vincent ; Lysowec, Mélanie ; Suski, Jan ; Demeûs, Laurent ; Renaux, Christian ; Adriaensen, Stéphane ; Flandre, Denis. Low-noise SOI Hall devices. SPIE Fluctuations and Noise Symposium (Santa Fe (USA), du 01/06/2003 au 04/06/2003). In: Proceedings of SPIE Fluctuations and Noise Symposium, 2003, 196-203. doi:10.1117/12.490185. doi:10.1117/12.490185.
2002
Flandre, Denis ; Adriaensen, Stéphane ; Afzalian, Aryan ; Laconte, Jean ; Levacq, David ; Renaux, Christian ; Vancaillie, Laurent ; Raskin, Jean-Pierre ; Demeûs, Laurent ; Delatte, Pierre ; Dessard, Vincent ; Picun, G.. Intelligent SOI CMOS Integrated Circuits and Sensors for Heterogeneous Environments and Applications. IEEE Sensors 2002 (Orlando (USA), du 12/06/2002 au 14/06/2002). In: Proceedings of the IEEE Sensors 2002, 2002. 0-7803-7454-1, p. 1407-1412. doi:10.1109/ICSENS.2002.1037327.
2001
Flandre, Denis ; Adriaensen, Stéphane ; Akheyar, A. ; Crahay, André ; Demeus, L. ; Delatte, Pierre ; Dessard, V. ; Iniguez, B. ; Neve, A. ; Katschmarskyj, Bohdan ; Loumaye, Pierre ; Laconte, J. ; Martinez, I ; Picun, G. ; Rauly, E. ; Renaux, Christian ; Spote, David ; Zitout, Miloud ; Dehan, Morin ; Parvais, Bertrand ; Simon, Pascal ; Vanhoenacker-Janvier, Danielle ; Raskin, Jean-Pierre. Fully depleted SOI CMOS technology for heterogeneous micropower, high-temperature or RF microsystems. European Meeting on Silicon-on-Insulator Devices (EUROSOI-2000) (Granada (Spain), du 25/10/2000 au 27/10/2000). In: Solid-State Electronics, Vol. 45, no. 4, p. 541-549 (2001). In: , 2001. doi:10.1016/S0038-1101(01)00084-3.
2001
Quévy, E. ; Galayko, D. ; Legrand, B. ; Renaux, Christian ; Combi, C. ; Flandre, Denis ; Buchaillot, L. ; Collard, D. ; Vigna, B. ; Kaiser, A.. IF MEMS Filters for Mobile Communication. 8th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA’01) (Antibes Juan-les-pins (France), du 15/10/2001 au 18/10/2001). In: Proceedings of the 8th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA’01), 2001, 733-736.
2001
Quévy, E. ; Renaux, Christian ; Buchaillot, L. ; Flandre, Denis ; Collard, D.. MEMS for mobile communication. 13th European Microelectronics and Packaging Conference and Exhibition (IMAPS’01) (Strasbourg (France), du 30/05/2001 au 31/05/2001). In: Proceedings of the 13th European Microelectronics and Packaging Conference and Exhibition (IMAPS’01), 2001, 129-134.
2001
Flandre, Denis ; Adriaensen, S. ; Akheyar, A. ; Demeûs, L. ; Delatte, P. ; Dessard, V. ; Iniguez, B. ; Nève, A. ; Laconte, J. ; Picun, G. ; Rauly, E. ; Renaux, Christian ; Dehan, M. ; Parvais, B. ; Vanhoenacker-Janvier, Danielle ; Raskin, Jean-Pierre. Sensors implementations in Silicon-on-Insulator CMOS compatible technology for micropower, radio-frequency or high-temperature applications. Colloque Micro/nano: quels défis pour l’industrie ? (Louvain-la-Neuve (Belgium), 28/09/2001). In: Proceedings du Colloque Micro/nano: quels défis pour l’industrie ?, 2001.
2000
Demeûs, Laurent ; Delatte, Pierre ; Dessard, Vincent ; Adriaensen, Stéphane ; Renaux, Christian ; Flandre, Denis. A review of fully-depleted SOI CMOS technology for microsystems. 3rd International Conference on Micro Materials (Berlin (Germany), du 17/04/2000 au 19/04/2000). In: Proceedings of the 3rd International Conference on Micro Materials, 2000, 69-72.
2000
Raskin, Jean-Pierre ; Vanhoenacker-Janvier, Danielle ; Dehan, M. ; Goffioul, Pauline ; Simon, Pascal ; Iniguez, Benjamin ; Renaux, Christian ; Flandre, Denis. SOI CMOS for Low-Voltage, Low-Power Microwave Applications. EUROSOI 2000 Meeting on Silicon-on-Insulator Devices (Granada (Espagne), du 26/10/2000 au 27/10/2000). In: Proceedings of the EUROSOI 2000 Meeting on Silicon-on-Insulator Devices, 2000, 35-38.
1999
Renaux, Christian ; Scheuren, Vinciane ; Flandre, Denis. New experiments on the electrodeposition of iron in porous silicon. 10th Workshop on dielectrics in microelectronics (Barcelona (Spain), du 3/11/1999 au 5/11/1999). In: Proceedings of the 10th Workshop on dielectrics in microelectronics, 1999, 203-204.
1999
Demeûs, Laurent ; Delatte, Pierre ; Dessard, Vincent ; Adriaensen, Stéphane ; Renaux, Christian ; Flandre, Denis. The art of high-temperature FD-SOI CMOS. Conference HITEN 1999 (Berlin (Germany), du 4/07/1999 au 7/07/1999). In: Proceedings of HITEN 1999, IEEE, 1999, 97-99. doi:10.1109/HITEN.1999.827472. doi:10.1109/HITEN.1999.827472.
1998
Dessard, Vincent ; Demeûs, Laurent ; Viviani, A. ; Adriaensen, Stéphane ; Binard, C. ; Crahay, André ; Renaux, Christian ; Loumaye, Pierre ; Spote, David ; Flandre, Denis ; Katschmarskyj, Bohdan. Integrated sensors and electronic circuits in SOI technology for high-temperature applications. Forum Microsystems (Liège (Belgium), du 26/05/1998 au 27/05/1998). In: , 1998.
2013
Bawedin, Maryline ; Cristoloveanu, Sorin Ioan ; Flandre, Denis ; Renaux, Christian ; Crahay, André. Double-gate floating-body memory device. Numéro de priorité ; Déposé (05/01/2009) ; Publié (05/03/2013). US.