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IMMC

Michaël Coulombier
Post-doctoral researcher
Dr. at UCL in 2012
Contact

Main project: Renforcement des capacités de RDI des organismes de recherche dans les domaines utiles aux PME
Funding: FEDER Micro+
Supervisor(s): Thomas Pardoen

graduated as a material science engineer from UCL in 2006. He finished his PhD in 2012 under the supervision of Prof. Thomas Pardoen (iMMC) and Prof. Jean-Pierre Raskin (ICTEAM) developing a lab on-chip technique for nano-mechanical characterisation of thin films. Since then he has been a research assistant in iMMC involved in various projects dealing with material science, nanomechanical testing and tribology.

IMMC main research direction(s):
Processing and characterisation of materials

Keywords:
fracture mechanics
thin films
tribology

Research group(s): IMAP
Collaborations: Jean-Pierre Raskin

  

Recent publications

See complete list of publications

Journal Articles


1. Jaddi, Sahar; Coulombier, Michaël; Raskin, Jean-Pierre; Pardoen, Thomas. Crack on a chip test method for thin freestanding films. In: Journal of the Mechanics and Physics of Solids, Vol. 123, p. 267-291 (2019). doi:10.1016/j.jmps.2018.10.005. http://hdl.handle.net/2078.1/212157

2. Delannay, Laurent; Lemoine, Guerric; Coulombier, Michaël; Pardoen, Thomas. Modelling creep induced by internal stresses in freestanding submicron Cu film. In: IOP Conference Series: Materials Science and Engineering, Vol. 580, p. 012003 (2019). doi:10.1088/1757-899x/580/1/012003. http://hdl.handle.net/2078.1/224243

3. Poncelet, Olivier; Rasson, Jonathan; Tuyaerts, Romain; Coulombier, Michaël; Kotipalli, Ratan Raja Venkata; Raskin, Jean-Pierre; Francis, Laurent. Hemispherical cavities on silicon substrates: an overview of micro fabrication techniques. In: Materials Research Express, Vol. 5, no. 4, p. 045702 (2018). doi:10.1088/2053-1591/aab907. http://hdl.handle.net/2078.1/196589

4. Sandu, Georgiana; Coulombier, Michaël; Kumar, Vishank; Kassa, Hailu G.; Avram, Ionel; Ye, Ran; Stopin, Antoine; Bonifazi, Davide; Gohy, Jean-François; Leclère, Philippe; Gonze, Xavier; Pardoen, Thomas; Vlad, Alexandru; Melinte, Sorin. Kinked silicon nanowires-enabled interweaving electrode configuration for lithium-ion batteries. In: Scientific Reports, Vol. 8, p. 9794 (2018). doi:10.1038/s41598-018-28108-3. http://hdl.handle.net/2078.1/200156

5. Lapouge, Pierre; Onimus, F.; Coulombier, Michaël; Raskin, Jean-Pierre; Pardoen, Thomas. Creep behavior of submicron copper films under irradiation. In: Acta Materialia, Vol. 131, p. 77-87 (2017). doi:10.1016/j.actamat.2017.03.056. http://hdl.handle.net/2078.1/187194

6. Vayrette, Renaud; Galceran, M.; Coulombier, Michaël; Godet, S.; Raskin, Jean-Pierre; Pardoen, Thomas. Fracture mechanisms in freestanding polycrystalline silicon films with nanoscale thickness. In: Engineering Fracture Mechanics, Vol. 68, no.Part A, p. 190-203 (December 2016). doi:10.1016/j.engfracmech.2016.10.003. http://hdl.handle.net/2078.1/187227

7. Vayrette, Renaud; Galceran, M.; Coulombier, Michaël; Godet, S.; Raskin, Jean-Pierre; Pardoen, Thomas. Size dependent fracture strength and cracking mechanisms in freestanding polycrystalline silicon films with nanoscale thickness. In: Engineering Fracture Mechanics, Vol. 168, p. 190-203 (2016). doi:10.1016/j.engfracmech.2016.10.003. http://hdl.handle.net/2078.1/183941

8. Favache, Audrey; Sacre, Charles-Henry; Coulombier, Michaël; Libralesso, Laure; Guaino, Philippe; Raskin, Jean-Pierre; Bailly, Christian; Nysten, Bernard; Pardoen, Thomas. Fracture mechanics based analysis of the scratch resistance of thin brittle coatings on a soft interlayer. In: Wear, Vol. 330-331, p. 461-468 (2015). doi:10.1016/j.wear.2015.01.081. http://hdl.handle.net/2078.1/160853

9. Idrissi, Hosni; Kobler, Aaron; Amin-Ahmadi, Behnam; Coulombier, Michaël; Galceran, Montserrat; Raskin, Jean-Pierre; Godet, Stéphane; Kübel, Christian; Pardoen, Thomas; Schryvers, Dominique. Plasticity mechanisms in ultrafine grained freestanding aluminum thin films revealed by in-situ transmission electron microscopy nanomechanical testing. In: Applied Physics Letters, Vol. 104, no.10, p. 101903 (2014). doi:10.1063/1.4868124. http://hdl.handle.net/2078.1/142003

10. Vayrette, Renaud; Coulombier, Michaël; Pardoen, Thomas; Raskin, Jean-Pierre. On-chip MEMS-based internal stress actuated structures for the mechanical testing of freestanding thin film materials. In: Advanced Materials Research, Vol. 996, p. 833-840. doi:10.4028/www.scientific.net/AMR.996.833. http://hdl.handle.net/2078.1/187257


Patents


1. Pardoen, Thomas; Fabrègue, Damien; Raskin, Jean-Pierre; André, Nicolas; Coulombier, Michaël. Internal stress actuated micro- and nanomachines for testing physical properties of micro- and nano-sized material samples. http://hdl.handle.net/2078.1/75541 http://hdl.handle.net/2078.1/75541


Conference Papers


1. Jaddi, Sahar; Coulombier, Michaël; Raskin, Jean-Pierre; Pardoen, Thomas. On a chip fracture mechanics test method. http://hdl.handle.net/2078.1/204837

2. Pardoen, Thomas; Raskin, Jean-Pierre; Coulombier, Michaël; Jaddi, Sahar; Ghidelli, Matteo; Vayrette, Renaud; Idrissi, Hosni. On a chip MEMS based mechanical testing. http://hdl.handle.net/2078.1/214464

3. Idrissi, Hosni; Ghidelli, M.; Gravier, S.; Blandin, J.J.; Coulombier, Michaël; Raskin, Jean-Pierre; Schryvers, Dominique; Pardoen, Thomas. Atomistic plasticity mechanisms in metallic glass thin films : new insights from advanced transmission electron microscopy. http://hdl.handle.net/2078.1/200238

4. Pardoen, Thomas; Jaddi, Sahar; Coulombier, Michaël; Idrissi, Hosni; Raskin, Jean-Pierre. Fracture mechanics on a chip. http://hdl.handle.net/2078.1/214425

5. Ghidelli, Matteo; Coulombier, Michaël; Pardoen, Thomas; Idrissi, Hosni; Schülli, T.; Gravier, S.; Blandin, J.J.; Daudin, Rémi. On the processing, mechanical and structural characterization of ZrNi amorphous thin films. In: Proceedings of the 25th ISMANAM 2018, 2018, p. ID #274. http://hdl.handle.net/2078.1/214465

6. Lapouge, Pierre; Onimus, F.; Coulombier, Michaël; Raskin, Jean-Pierre; Pardoen, Thomas; Bréchet, Yves. On chip study of the irradiation creep behavior of copper films. http://hdl.handle.net/2078.1/214434

7. Daudin, Rémi; Coulombier, Michaël; Schülli, Tobias; Zhou, Tao; Idrissi, Hosni; Raskin, Jean-Pierre; Pardoen, Thomas. Etude de la déformation locale de films minces de verres métalliques par nano-diffraction de rayons X synchrotron. http://hdl.handle.net/2078.1/214484

8. Sandu, Georgiana; Coulombier, Michaël; Kumar, Vishank; Kassa, Hailu Gebru; Avram, Ionel; Ye, Ran; Stopin, A.; Bonifazi, D.; Gohy, Jean-François; Leclère, Philippe; Gonze, Xavier; Pardoen, Thomas; Vlad, Alexandru; Melinte, Sorin. Kinked silicon nanowires-based electrode configuration for lithium-ion batteries. http://hdl.handle.net/2078.1/184883

9. Ghidelli, Matteo; Gravier, S.; Blandin, J.-J.; Djemia, P.; Coulombier, Michaël; Vayrette, Renaud; Raskin, Jean-Pierre; Pardoen, Thomas. Viscoplastic and fracture behavior of ZrNi freestanding metallic glass films. In: Book of abstracts, 2015. http://hdl.handle.net/2078.1/173267

10. Pardoen, Thomas; Coulombier, Michaël; Colla, Marie-Stéphane; Lemoine, Guerric; Vayrette, Renaud; Ghidelli, Matteo; Blandin, Jean-Jacques; Gravier, Sébastien; Delannay, Laurent; Raskin, Jean-Pierre. Size dependent plastic localization in thin nanocrystalline or amorphous metallic films. http://hdl.handle.net/2078.1/173420


Dissertations


1. Coulombier, Michaël. Nanomechanical lab on-chip for testing thin film materials and application to Al and Al(Si), prom. : Pardoen, Thomas ; Raskin, Jean-Pierre, 06/03/2012. http://hdl.handle.net/2078.1/109518